[gegl] tests: diffraction-patterns test superceded by op reference
- From: Øyvind Kolås <ok src gnome org>
- To: commits-list gnome org
- Cc:
- Subject: [gegl] tests: diffraction-patterns test superceded by op reference
- Date: Mon, 13 Mar 2017 21:12:53 +0000 (UTC)
commit 4f2d82abfbd2b0dfd4ab1978f87d25d21d8db7b1
Author: Øyvind Kolås <pippin gimp org>
Date: Mon Mar 13 22:09:35 2017 +0100
tests: diffraction-patterns test superceded by op reference
tests/compositions/Makefile.am | 1 -
tests/compositions/diffraction-patterns.xml | 17 -----------------
.../reference/diffraction-patterns.png | Bin 212438 -> 0 bytes
3 files changed, 0 insertions(+), 18 deletions(-)
---
diff --git a/tests/compositions/Makefile.am b/tests/compositions/Makefile.am
index 1ece248..306d8b0 100644
--- a/tests/compositions/Makefile.am
+++ b/tests/compositions/Makefile.am
@@ -29,7 +29,6 @@ TESTS = \
convolve2.xml \
composite-transform.xml \
contrast-curve.xml \
- diffraction-patterns.xml \
edge.xml \
edge-laplace.xml \
edge-sobel.xml \
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